IGBT lifetime model considering composite failure modes
Lie Li, Yigang He, Lei Wang, Chuankun Wang, Xiaoyan Liu
Topics & Concepts
Weibull distributionInsulated-gate bipolar transistorMaterials scienceCoupling (piping)Power (physics)SolderingReliability engineeringComposite materialEngineeringStatisticsThermodynamicsMathematicsPhysicsSilicon Carbide Semiconductor TechnologiesElectrostatic Discharge in ElectronicsSilicon and Solar Cell Technologies