A versatile Johansson-type tender x-ray emission spectrometer
S. Nowak, Rebecca Armenta, Craig P. Schwartz, Alessandro Gallo, Baxter Abraham, Angel T. Garcia‐Esparza, Elisa Biasin, A. del Prado, A. C. Maciel, D. Zhang, D. R. Day, Sarah Christensen, Thomas Kröll, Roberto Alonso‐Mori, Dennis Nordlund, T.-C. Weng, Dimosthenis Sokaras
Abstract
We present a high energy resolution x-ray spectrometer for the tender x-ray regime (1.6-5.0 keV) that was designed and operated at Stanford Synchrotron Radiation Lightsource. The instrument is developed on a Rowland geometry (500 mm of radius) using cylindrically bent Johansson analyzers and a position sensitive detector. By placing the sample inside the Rowland circle, the spectrometer operates in an energy-dispersive mode with a subnatural line-width energy resolution (∼0.32 eV at 2400 eV), even when an extended incident x-ray beam is used across a wide range of diffraction angles (∼30° to 65°). The spectrometer is enclosed in a vacuum chamber, and a sample chamber with independent ambient conditions is introduced to enable a versatile and fast-access sample environment (e.g., solid/gas/liquid samples, in situ cells, and radioactive materials). The design, capabilities, and performance are presented and discussed.