A High-Sensitivity Charge Sensor for Silicon Qubits above 1 K
Jonathan Y. Huang, Wee Han Lim, Ross C. C. Leon, Chih Hwan Yang, Fay E. Hudson, Christopher C. Escott, André Saraiva, Andrew S. Dzurak, Arne Laucht
Abstract
Recent studies of silicon spin qubits at temperatures above 1 K are encouraging demonstrations that the cooling requirements for solid-state quantum computing can be considerably relaxed. However, qubit readout mechanisms that rely on charge sensing with a single-island single-electron transistor (SISET) quickly lose sensitivity due to thermal broadening of the electron distribution in the reservoirs. Here we exploit the tunneling between two quantized states in a double-island single-electron transistor (SET) to demonstrate a charge sensor with an improvement in the signal-to-noise ratio by an order of magnitude compared to a standard SISET, and a single-shot charge readout fidelity above 99% up to 8 K at a bandwidth greater than 100 kHz. These improvements are consistent with our theoretical modeling of the temperature-dependent current transport for both types of SETs. With minor additional hardware overhead, these sensors can be integrated into existing qubit architectures for a high-fidelity charge readout at few-kelvin temperatures.