Electric-field-driven interfacial trapping of drifting triboelectric charges <i>via</i> contact electrification
Jin‐Kyeom Kim, Gi Hyeon Han, Sun‐Woo Kim, Hee Jun Kim, Rahul Purbia, Dong-Min Lee, Jong Kyu Kim, Hee Jae Hwang, Hyun‐Cheol Song, Dukhyun Choi, Sang‐Woo Kim, Zhong Lin Wang, Jeong Min Baik
Abstract
A new facile strategy to maximize the charge density over 1000 μC m −2 for a high-output TENG is demonstrated by introducing new physics in contact electrification, i.e. ‘Electric-field-driven interfacial trapping of drifting triboelectric charges’.
Topics & Concepts
Triboelectric effectContact electrificationElectrificationTrappingElectric fieldCharge (physics)Electrostatic inductionMaterials scienceElectrical engineeringEngineering physicsOptoelectronicsPhysicsEngineeringElectrodeComposite materialElectricityQuantum mechanicsEcologyBiologyAdvanced Sensor and Energy Harvesting MaterialsMolecular Junctions and NanostructuresAdvanced Memory and Neural Computing