Entanglement-Enhanced Magnetic Induction Tomography
Wenqiang Zheng, Hengyan Wang, Rebecca Schmieg, Alan Oesterle, E. S. Polzik
Abstract
Magnetic induction tomography (MIT) is a sensing protocol exploring conductive objects via their response to radio-frequency magnetic fields. MIT is used in nondestructive testing ranging from geophysics to medical applications. Atomic magnetometers, employed as MIT sensors, allow for significant improvement of the MIT sensitivity and for exploring its quantum limits. Here, we propose and verify a quantum-enhanced version of the atomic MIT by combining it with conditional spin squeezing and stroboscopic backaction evasion. We use this quantum enhancement to demonstrate sensitivity beyond the standard quantum limits of one-dimensional quantum MIT detecting a conductive sample.