New opportunities at the Materials Science Beamline at ESRF to exploit high energy nano-focus X-ray beams
Jonathan P. Wright, Carlotta Giacobbe, Marta Majkut
Topics & Concepts
BeamlineMaterials scienceSynchrotronImage resolutionOpticsDiffractionResolution (logic)X-rayScannerBeam (structure)PhysicsComputer scienceArtificial intelligenceAdvanced X-ray Imaging TechniquesAdvanced X-ray and CT ImagingX-ray Spectroscopy and Fluorescence Analysis