Litcius/Paper detail

Semi-supervised imbalanced classification of wafer bin map defects using a Dual-Head CNN

Siyamalan Manivannan

2023Expert Systems with Applications22 citationsDOI

Topics & Concepts

Computer scienceArtificial intelligenceClassifier (UML)Convolutional neural networkLeverage (statistics)Machine learningPattern recognition (psychology)BinData miningAlgorithmIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Surface Polishing Techniques
Semi-supervised imbalanced classification of wafer bin map defects using a Dual-Head CNN | Litcius