Structural, optical and optoelectrical analysis of a new window layer based on ZnAl2S4 thin films

I.M. El Radaf, M.S. AlKhalifah, M.S. El‐Bana

2020Journal of Materials Science Materials in Electronics27 citationsDOI

Topics & Concepts

Materials scienceThin filmChalcogenideLayer (electronics)Refractive indexConductivityPorosityOptoelectronicsTernary operationSurface finishBand gapComposite materialOpticsNanotechnologyChemistryPhysical chemistryProgramming languageComputer sciencePhysicsChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesPhase-change materials and chalcogenides