Microstructure evolution, dielectric properties, and nonlinear response of Na<sup>+</sup>-doped CdCu<sub>3</sub>Ti<sub>4</sub>O<sub>12</sub> ceramics
Renzhong Xue, Xiaosong Liu, Kun Yang, Xiang Zhu
Abstract
= 0.08, which were associated with its highest grain boundary resistance and barrier height. Electric modulus data proved that dielectric relaxation at low frequencies was associated with grain boundaries. Dielectric anomalies in the high temperature range were attributed to oxygen vacancies.
Topics & Concepts
MicrostructureDopingDielectricCeramicMaterials scienceAnalytical Chemistry (journal)Nonlinear systemElectric fieldMineralogyChemistryMetallurgyPhysicsOptoelectronicsChromatographyQuantum mechanicsDielectric properties of ceramicsFerroelectric and Piezoelectric MaterialsMicrowave Dielectric Ceramics Synthesis