A new class of bivariate Lindley distributions based on stress and shock models and some of their reliability properties
Ricardo Puziol de Oliveira, Jorge Alberto Achcar, Josmar Mazucheli, Wesley Bertoli
Topics & Concepts
Bivariate analysisReliability (semiconductor)Class (philosophy)Stress (linguistics)MathematicsShock (circulatory)Reliability engineeringEconometricsApplied mathematicsStatisticsComputer scienceEngineeringPhysicsArtificial intelligenceThermodynamicsLinguisticsMedicinePower (physics)PhilosophyInternal medicineStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering DesignReliability and Maintenance Optimization