Large-Scale characterization of Two-Dimensional Monolayer MoS2 Island Domains Using Spectroscopic Ellipsometry and Reflectometry
Omer Luria, Pranab K. Mohapatra, Avinash Patsha, Abraham Kribus, Ariel Ismach
Topics & Concepts
ReflectometryCharacterization (materials science)Materials scienceEllipsometryRaman spectroscopyMonolayerChemical vapor depositionNanotechnologyPhotoluminescenceDispersion (optics)SpectroscopyOptoelectronicsThin filmOpticsComputer sciencePhysicsTime domainComputer visionQuantum mechanics2D Materials and ApplicationsMXene and MAX Phase MaterialsGraphene research and applications