Correlated Kelvin-probe force microscopy, micro-FTIR and micro-Raman analysis of doping anisotropy in multisectorial boron-doped HPHT diamonds
А.С. Ніколенко, V. V. Strelchuk, P. M. Lytvyn, Ihor Danylenko, S.V. Malyuta, A.G. Gontar, S. P. Starik, Т.В. Коваленко, С. А. Ивахненко
Topics & Concepts
Raman spectroscopyKelvin probe force microscopeMaterials scienceBoronDopingDiamondFourier transform infrared spectroscopyAnalytical Chemistry (journal)ImpurityMicroscopyNanotechnologyChemistryOpticsOptoelectronicsAtomic force microscopyComposite materialOrganic chemistryChromatographyPhysicsDiamond and Carbon-based Materials ResearchForce Microscopy Techniques and ApplicationsMetal and Thin Film Mechanics