Stacking fault-induced strengthening mechanism in thermoelectric semiconductor Bi2Te3
Xiege Huang, Xiaobin Feng, Qi An, Ben Huang, Xiaolian Zhang, Zhongtao Lu, Guodong Li, Pengcheng Zhai, Bo Duan, G. Jeffrey Snyder, William A. Goddard, Qingjie Zhang
Topics & Concepts
StackingThermoelectric effectSemiconductorMaterials scienceStacking faultMechanism (biology)Fault (geology)Condensed matter physicsOptoelectronicsComposite materialGeologyPhysicsDislocationThermodynamicsQuantum mechanicsSeismologyNuclear magnetic resonanceAdvanced Thermoelectric Materials and DevicesThermal properties of materialsTopological Materials and Phenomena