Two-phase degradation modeling and remaining useful life prediction using nonlinear wiener process
Jingdong Lin, Guobo Liao, Min Chen, Hongpeng Yin
Topics & Concepts
Wiener processRandomnessDegradation (telecommunications)Nonlinear systemReliability (semiconductor)Process (computing)Phase (matter)EngineeringComputer scienceControl theory (sociology)Mathematical optimizationMathematicsApplied mathematicsStatisticsArtificial intelligenceOperating systemOrganic chemistryControl (management)ChemistryQuantum mechanicsTelecommunicationsPhysicsPower (physics)Reliability and Maintenance OptimizationMachine Fault Diagnosis TechniquesRisk and Safety Analysis