Design of a soft error hardened SRAM cell with improved access time for embedded systems
V. K. Tomar, Ashish Sachdeva
Topics & Concepts
Static random-access memoryComputer scienceSoft errorAccess timeTransistorElectronic circuitComputer hardwarePower (physics)DissipationEmbedded systemVoltageSchmitt triggerElectronic engineeringElectrical engineeringPhysicsEngineeringQuantum mechanicsThermodynamicsLow-power high-performance VLSI designRadiation Effects in ElectronicsSemiconductor materials and devices