AI-enhanced time–frequency domain reflectometry for robust series arc fault detection in DC grids
Hwa-Pyeong Park, Gu-Young Kwon, Chun-Kwon Lee, Seung Jin Chang
Topics & Concepts
ReflectometrySeries (stratigraphy)Frequency domainTime domainFault (geology)Arc-fault circuit interrupterArc (geometry)Fault detection and isolationElectronic engineeringComputer scienceEngineeringElectrical engineeringGeologyVoltageSeismologyShort circuitPaleontologyComputer visionActuatorMechanical engineeringElectrical Fault Detection and ProtectionIntegrated Circuits and Semiconductor Failure AnalysisRisk and Safety Analysis