A triple-node upset self-healing latch for high speed and robust operation in radiation-prone harsh-environment
Sandeep Kumar, Atin Mukherjee
Topics & Concepts
Robustness (evolution)UpsetSingle event upsetSoft errorNode (physics)Monte Carlo methodRadiationComputer sciencePower (physics)Embedded systemElectronic engineeringComputer hardwarePhysicsChemistryEngineeringStatic random-access memoryMechanical engineeringMathematicsBiochemistryStatisticsQuantum mechanicsGeneRadiation Effects in ElectronicsSemiconductor materials and devicesVLSI and Analog Circuit Testing