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Low-energy proton-induced single event effect in NAND flash memories

Cong Peng, Wei Chen, Yinhong Luo, Fengqi Zhang, Xiaobin Tang, Zibo Wang, Lili Ding, Xiaoqiang Guo

2020Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment13 citationsDOI

Topics & Concepts

ProtonFlash (photography)NAND gateSingle event upsetEvent (particle physics)Sensitivity (control systems)Energy (signal processing)Nuclear physicsAtomic physicsPhysicsOpticsLogic gateElectrical engineeringElectronic engineeringEngineeringStatic random-access memoryQuantum mechanicsRadiation Effects in ElectronicsSemiconductor materials and devicesAdvanced Memory and Neural Computing
Low-energy proton-induced single event effect in NAND flash memories | Litcius