A Review: Principles and Applications of High-Pressure In Situ Time-Resolved Transient Absorption Spectroscopy
Xiaxia Qin, Guozhao Zhang, Lin Chen, Qinglin Wang, Guangyu Wang, Haiwa Zhang, Yinwei Li, Cailong Liu
Abstract
Time-resolved transient absorption (TA) spectroscopy measurement technology provides detailed information into the ultrafast dynamics by tracking the transitions and deactivation processes of the excited-state carriers, which holds vast potential for investigating processes related to the luminescence and nonradiative recombination of materials. Pressure is considered a potent tool for tuning the carrier dynamic behaviors. The combination of high-pressure experimental technology and time-resolved TA spectroscopy measurement technology enables researchers to reveal the inherent relation between the structure and optical properties of materials, which is crucial for optimizing material performance and applications in the field of optoelectronics. In this review, the principles and the theoretical foundations of high-pressure time-resolved TA spectroscopy measurement technology will be introduced, and the research advancements in ultrafast dynamics processes of materials under high pressure will be summarized and discussed. In addition, we will expound on the future prospects of time-resolved TA spectroscopy measurement technology to detect the ultrafast dynamic behaviors of materials and complexes under the coregulation of temperature and pressure.