Thickness profiling of transparent plate using wavelength-tuned phase-shifting analysis
Yangjin Kim, Young Hoon Moon, Kenichi Hibino, Mamoru Mitsuishi
Topics & Concepts
Fizeau interferometerInterferometryRepeatabilityNonlinear systemAlgorithmFrame (networking)Phase (matter)OpticsProfiling (computer programming)WavelengthStandard deviationComputer scienceMathematicsPhysicsAstronomical interferometerTelecommunicationsStatisticsOperating systemQuantum mechanicsOptical measurement and interference techniquesImage Processing Techniques and ApplicationsOptical Systems and Laser Technology