Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process
Yiming Yang, Jianxin Peng, C.S. Cai, Yadong Zhou, Lei Wang, Jianren Zhang
Topics & Concepts
Reliability (semiconductor)Degradation (telecommunications)Reliability engineeringStochastic processGamma processParametric statisticsHazardClassification of discontinuitiesEngineeringComputer scienceMathematicsStatisticsQuantum mechanicsMathematical analysisTelecommunicationsPhysicsPower (physics)Organic chemistryChemistryConcrete Corrosion and DurabilityInfrastructure Maintenance and MonitoringReliability and Maintenance Optimization