Metric-based meta-learning model for few-shot fault diagnosis under multiple limited data conditions
Duo Wang, Ming Zhang, Yuchun Xu, Weining Lu, Jun Yang, Tao Zhang
Topics & Concepts
Computer scienceFault (geology)Data miningMetric (unit)Artificial intelligenceMachine learningExploitSample (material)EmbeddingFeature (linguistics)Similarity (geometry)Feature vectorPattern recognition (psychology)EngineeringOperations managementSeismologyChromatographyGeologyComputer securityChemistryPhilosophyImage (mathematics)LinguisticsMachine Fault Diagnosis TechniquesDomain Adaptation and Few-Shot LearningOccupational Health and Safety Research