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Demonstration of >6.0-kV Breakdown Voltage in Large Area Vertical GaN p-n Diodes With Step-Etched Junction Termination Extensions

Luke Yates, Brendan Gunning, Mary H. Crawford, Jeffrey Steinfeldt, Michael L. Smith, Vincent M. Abate, Jeramy Ray Dickerson, Andrew Armstrong, Andrew Binder, Andrew A. Allerman, Robert Kaplar

2022IEEE Transactions on Electron Devices61 citationsDOIOpen Access PDF

Abstract

Vertical gallium nitride (GaN) p-n diodes have garnered significant interest for use in power electronics where high-voltage blocking and high-power efficiency are of concern. In this article, we detail the growth and fabrication methods used to develop a large area (1 mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> ) vertical GaN p-n diode capable of a 6.0-kV breakdown. We also demonstrate a large area diode with a forward pulsed current of 3.5 A, an 8.3- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{m}\boldsymbol \Omega \cdot {\text{cm}}^{2}$ </tex-math></inline-formula> differential specific ON-resistance, and a 5.3-kV reverse breakdown. In addition, we report on a smaller area diode (0.063 mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> ) that is capable of 6.4-kV breakdown with a differential specific ON-resistance of 10.2 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{m}\boldsymbol \Omega \cdot {\text{cm}}^{2}$ </tex-math></inline-formula> , when accounting for current spreading through the drift region at a 45° angle. Finally, the demonstration of avalanche breakdown is shown for a 0.063-mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> diode with a room temperature breakdown of 5.6 kV. These results were achieved via epitaxial growth of a 50- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$ \mu \text{m}$ </tex-math></inline-formula> drift region with a very low carrier concentration of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$&lt; 1\times10$ </tex-math></inline-formula> <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">15</sup> cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">−3</sup> and a carefully designed four-zone junction termination extension.

Topics & Concepts

DiodeBreakdown voltageGallium nitridePhysicsElectroluminescenceOptoelectronicsElectrical engineeringTopology (electrical circuits)Analytical Chemistry (journal)Materials scienceVoltageNanotechnologyChemistryQuantum mechanicsEngineeringChromatographyLayer (electronics)GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor TechnologiesGa2O3 and related materials