Impact of Noise and Interface Trap Charge on a Heterojunction Dual-Gate Vertical TFET Device
Karthik Nasani, Brinda Bhowmick, Puspa Devi Pukhrambam
Topics & Concepts
HeterojunctionNoise (video)OptoelectronicsQuantum tunnellingWork functionMaterials scienceFlicker noiseInfrasoundNoise spectral densityPhysicsNoise figureNanotechnologyAcousticsComputer scienceLayer (electronics)CMOSImage (mathematics)AmplifierArtificial intelligenceAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesFerroelectric and Negative Capacitance Devices