Simulation of attenuation of ionizing radiation due to protective casing of circuits
Aleksandr Poluektov, Roman Medvedev, Anton Zarevich
Abstract
The article examines the influence of the electromagnetic field generated as a result of a nuclear explosion and the degree of negative impact on the CMOS semiconductor. The possibility of providing protection of semiconductor devices from radiation using a protective housing is assessed. A review of the various materials that are used to construct protective screens is carried out, the level of protection of various substances from different types of radiation, their positive and negative sides, in particular their weight, their joint use, and the inability to protect against the entire spectrum of radiation. A mathematical model for designing a protective screen containing four layers and limited in both weight and thickness is being built. As a computer experiment, a program in the C# programming language was developed based on a mathematical model, which provided the calculation of the optimal parameters of the protective case, which will ensure effective protection of the device. Modeling the protective enclosure allows you to preliminarily assess the effectiveness of the protection and take measures to strengthen it, if necessary. This reduces the risk of damage to the device and ensures its reliable operation even under conditions of increased radiation exposure.