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Machine Learning for Optical Scanning Probe Nanoscopy

Xinzhong Chen, Suheng Xu, Sara Shabani, Yueqi Zhao, Matthew Fu, Andrew J. Millis, M. M. Fogler, Abhay N. Pasupathy, Mengkun Liu, D. N. Basov

2022Advanced Materials36 citationsDOIOpen Access PDF

Abstract

The ability to perform nanometer-scale optical imaging and spectroscopy is key to deciphering the low-energy effects in quantum materials, as well as vibrational fingerprints in planetary and extraterrestrial particles, catalytic substances, and aqueous biological samples. These tasks can be accomplished by the scattering-type scanning near-field optical microscopy (s-SNOM) technique that has recently spread to many research fields and enabled notable discoveries. Herein, it is shown that the s-SNOM, together with scanning probe research in general, can benefit in many ways from artificial-intelligence (AI) and machine-learning (ML) algorithms. Augmented with AI- and ML-enhanced data acquisition and analysis, scanning probe optical nanoscopy is poised to become more efficient, accurate, and intelligent.

Topics & Concepts

Near-field scanning optical microscopeMaterials scienceNanotechnologyNanometreSpectroscopyOptical microscopeScanning probe microscopyMicroscopyScanning electron microscopeOpticsPhysicsQuantum mechanicsComposite materialNear-Field Optical MicroscopyForce Microscopy Techniques and ApplicationsSurface and Thin Film Phenomena
Machine Learning for Optical Scanning Probe Nanoscopy | Litcius