Lateral ion migration accelerates degradation in halide perovskite devices
Daniel A. Jacobs, Christian M. Wolff, Xinyu Chin, Kerem Artuk, Christophe Ballif, Quentin Jeangros
Abstract
The migration of mobile ions in the plane of the substrate is shown to have important effects on device behaviour and stability, especially near electrode boundaries.
Topics & Concepts
HalideDegradation (telecommunications)Perovskite (structure)IonMaterials scienceOptoelectronicsChemical engineeringChemistryInorganic chemistryCrystallographyComputer scienceTelecommunicationsEngineeringOrganic chemistryPerovskite Materials and ApplicationsConducting polymers and applicationsAdvanced battery technologies research