Litcius/Paper detail

Performance of quantum kernel on initial learning process

Takao Tomono, Satoko Natsubori

2022EPJ Quantum Technology15 citationsDOIOpen Access PDF

Abstract

Abstract For many manufacturing companies, the production line is very important. In recent years, the number of small-quantity, high-mix products have been increasing, and the identification of good and defective products must be carried out efficiently. At that time, machine learning is a very important issue on shipping inspection using small amounts of data. Quantum machine learning is one of most exciting prospective applications of quantum technologies. SVM using kernel estimation is one of most popular methods for classifiers. Our purpose is to search quantum advantage on classifier to enable us to classifier in inspection test for small size datasets. In this study, we made clear the difference between classical and quantum kernel learning in initial state and propose analysis of learning process by plotting ROC space. To meet the purpose, we investigated the effect of each feature map compared to classical one, using evaluation index. The simulation results show that the learning model construction process between quantum and classical kernel learning is different in initial state. Moreover, the result indicates that the learning model of quantum kernel is the method to decrease the false positive rate (FPR) from high FPR, keeping high true positive rates on several datasets. We demonstrate that learning process on quantum kernel is different from classical one in initial state and plotting to ROC space graph is effective when we analyse the learning model process.

Topics & Concepts

Artificial intelligenceKernel (algebra)Computer scienceClassifier (UML)QuantumMachine learningSupport vector machineQuantum machine learningKernel methodFeature vectorQuantum statePattern recognition (psychology)Quantum algorithmMathematicsPhysicsQuantum mechanicsCombinatoricsImbalanced Data Classification TechniquesIndustrial Vision Systems and Defect DetectionMachine Learning and ELM