Understanding the impact of the cooling ramp of the fast-firing process on light- and elevated-temperature-induced degradation
Benjamin Hammann, Nicole Aßmann, Jonas Schön, Wolfram Kwapil, Florian Schindler, Sebastian Roder, E. V. Monakhov, Martin C. Schubert
Topics & Concepts
HydrogenWaferDegradation (telecommunications)DiffusionSiliconMaterials scienceSolar cellPassivationChemistryChemical physicsAnalytical Chemistry (journal)OptoelectronicsThermodynamicsNanotechnologyElectronic engineeringLayer (electronics)ChromatographyEngineeringPhysicsOrganic chemistrySilicon and Solar Cell TechnologiesThin-Film Transistor TechnologiesSemiconductor materials and interfaces