An advanced Bragg diffraction imaging technique to characterize defects: The examples of GaN and AlN
Thu Nhi Tran Caliste, Lutz Kirste, J. Baruchel
Topics & Concepts
Materials scienceOpticsDiffractionDiffraction topographySynchrotron radiationCharacterization (materials science)Gallium nitrideBragg's lawSynchrotronImage resolutionX-ray crystallographyOptoelectronicsPhysicsNanotechnologyLayer (electronics)GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devices