Multi-source data fusion technique for parametric fault diagnosis in analog circuits
Manas Kumar Parai, Supriyo Srimani, Kasturi Ghosh, Hafizur Rahaman
Topics & Concepts
Analogue electronicsParametric statisticsFilter (signal processing)Electronic circuitComputer scienceFault (geology)Artificial intelligencePattern recognition (psychology)Electronic engineeringEngineeringMathematicsComputer visionSeismologyStatisticsElectrical engineeringGeologyIntegrated Circuits and Semiconductor Failure AnalysisVLSI and Analog Circuit TestingIndustrial Vision Systems and Defect Detection