Comparative Analysis of the Effects of Trap Charges onSingle- and Double-Gate Extended-Source Tunnel FET withδp+ SiGe Pocket Layer
Jagritee Talukdar, Gopal Rawat, Kunal Singh, Kavicharan Mummaneni
Topics & Concepts
Trap (plumbing)Materials scienceOptoelectronicsField-effect transistorGate oxideOxideTransistorSiliconSubthreshold swingTunnel field-effect transistorElectrical engineeringVoltagePhysicsEngineeringMeteorologyMetallurgySemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure Analysis