Multi-scale GAN with transformer for surface defect inspection of IC metal packages
Kaiqiong Chen, Nian Cai, Zhenshuang Wu, Hao Xia, Shuai Zhou, Han Wang
Topics & Concepts
Computer scienceEncoderArtificial intelligenceTransformerDeep learningPattern recognition (psychology)Electrical engineeringEngineeringVoltageOperating systemIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques