The epsilon expansion of the O(N) model with line defect from conformal field theory
Tatsuma Nishioka, Yoshitaka Okuyama, Soichiro Shimamori
Abstract
A bstract We employ the axiomatic framework of Rychkov and Tan to investigate the critical O( N ) vector model with a line defect in (4 − ϵ ) dimensions. We assume the fixed point is described by defect conformal field theory and show that the critical value of the defect coupling to the bulk field is uniquely fixed without resorting to diagrammatic calculations. We also study various defect localized operators by the axiomatic method, where the analyticity of correlation functions plays a crucial role in determining the conformal dimensions of defect composite operators. In all cases, including operators with operator mixing, we reproduce the leading anomalous dimensions obtained by perturbative calculations.