Bulk and surface characteristics of co-electrodeposited Cu2FeSnS4 thin films sulfurized at different annealing temperatures
Outman El Khouja, Constantin Catalin Negrila, Khalid Nouneh, M. Secu, M. Ebn Touhamı, Elena Matei, Viorica Stancu, Monica Enculescu, V. Kuncser, Aurelian Catalin Galca
Topics & Concepts
X-ray photoelectron spectroscopyMaterials scienceRaman spectroscopyAnnealing (glass)CrystallinityAnalytical Chemistry (journal)ChalcogenideBand gapPhotoluminescenceSpectroscopyThin filmChemical engineeringNanotechnologyMetallurgyChemistryOpticsOptoelectronicsComposite materialChromatographyQuantum mechanicsPhysicsEngineeringChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesCopper-based nanomaterials and applications