Litcius/Paper detail

Failure mechanism and life estimate of metallized film capacitor under high temperature and humidity

Yunxiao Tai, Pengqi Chen, Yang Jian, Qing‐Qing Fang, Xu Dang, Jigui Cheng

2022Microelectronics Reliability28 citationsDOI

Topics & Concepts

HumidityCapacitorMaterials scienceFailure mechanismComposite materialMechanism (biology)Engineering physicsElectrical engineeringForensic engineeringEngineeringMeteorologyPhysicsVoltageQuantum mechanicsDielectric materials and actuatorsHigh voltage insulation and dielectric phenomenaAdvanced Sensor and Energy Harvesting Materials
Failure mechanism and life estimate of metallized film capacitor under high temperature and humidity | Litcius