Towards Fine-Scale Yield Prediction of Three Major Crops of India Using Data from Multiple Satellite
Rojalin Tripathy, K. N. Chaudhari, G. D. Bairagi, Om Pal, Rajesh Das, Bimal K. Bhattacharya
Topics & Concepts
Yield (engineering)Scale (ratio)SatelliteGeographyRemote sensingEnvironmental scienceCartographyEngineeringPhysicsAerospace engineeringThermodynamicsRemote Sensing in AgricultureLeaf Properties and Growth MeasurementSmart Agriculture and AI