Performance degradation assessment of the three silicon PV technologies
Mustapha Adar, Youssef Najih, Ahmed Chebak, Mustapha Mabrouki, A. Bennouna
Abstract
Abstract This study investigates seasonal performance and assesses the annual degradation rates (R D ), of three types of silicon‐based PV module technologies, using four statistical methods, namely, linear regression (LR), classical seasonal decomposition (CSD), Holt‐Winters exponential smoothing (HW), and autoregressive integrated moving average (ARIMA) on a 5‐year temperature‐corrected DC‐performance ratio time series. The lowest performance degradation rates being exhibited are found for the polycrystalline silicon (pc‐Si) system with a R D values confined between 0.23%/year and 0.36%/year. The R D values provided by the four statistical methods to the monocrystalline silicon (mc‐Si) PV modules range from 0.40%/year to 0.77%/year. The values attributed to the annual performance degradation rate of PV modules of amorphous silicon technology typically range from 0.31%/year to 0.57%/year.