Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications
Christine Vanhoof, Jeffrey R. Bacon, Ursula E. A. Fittschen, László Vincze
Abstract
This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems.
Topics & Concepts
X-ray fluorescenceMass spectrometrySynchrotronAnalytical Chemistry (journal)X-rayMaterials scienceFluorescence spectrometryGamma ray spectrometryChemistryFluorescencePhysicsRadiochemistryEnvironmental chemistryOpticsChromatographyX-ray Spectroscopy and Fluorescence AnalysisNuclear Physics and ApplicationsX-ray Diffraction in Crystallography