Characterizing defect structures in AM steel using direct electron detection EBSD
Josh Kacher, Timothy Ruggles, Jordan Key, Matthew M. Nowell, Stuart I. Wright
Topics & Concepts
Electron backscatter diffractionDislocationMaterials scienceBurgers vectorElectron diffractionDiffractionFabricationWork (physics)ElectronMicrostructureCrystallographyOpticsMetallurgyComposite materialMechanical engineeringPhysicsEngineeringMedicineQuantum mechanicsPathologyChemistryAlternative medicineAdditive Manufacturing Materials and ProcessesWelding Techniques and Residual StressesMicrostructure and mechanical properties