Electrical characterization of SiC MOS capacitors: A critical review
Peyush Pande, Daniel Haasmann, Jisheng Han, Hamid Amini Moghadam, Philip Tanner, Sima Dimitrijev
Topics & Concepts
Characterization (materials science)Quantum tunnellingMaterials scienceOptoelectronicsConduction bandCapacitorBand gapThermal conductionElectronEnhanced Data Rates for GSM EvolutionEngineering physicsElectrical engineeringNanotechnologyComputer sciencePhysicsEngineeringVoltageTelecommunicationsComposite materialQuantum mechanicsSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesSemiconductor materials and interfaces