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Implementation of free-space Fourier Ptychography with near maximum system numerical aperture

Mingshu Liang, Changhuei Yang

2022Optics Express14 citationsDOIOpen Access PDF

Abstract

Over the past decade, the research field of Fourier Ptychographic Microscopy (FPM) has seen numerous innovative developments that significantly expands its utility. Here, we report a high numerical aperture (NA) FPM implementation that incorporates some of these innovations to achieve a synthetic NA of 1.9 - close to the maximum possible synthetic NA of 2 for a free space FPM system. At this high synthetic NA, we experimentally found that it is vital to homogenize the illumination field in order to achieve the best resolution. Our FPM implementation has a full pitch resolution of 266 nm for 465 nm light, and depth of field of 3.6 µm. In comparison, a standard transmission microscope (incoherent) with close to maximum possible NA of 0.95 has a full pitch resolution of 318 nm for 465 nm light, and depth of field of 0.65 µm. While it is generally assumed that a free-space coherent imaging system and a free-space incoherent imaging system operating at their respective maximum NA should give comparable resolution, we experimentally find that an FPM system significantly outperforms its incoherent standard microscopy counterpart in resolution by a factor of 20%. Coupled with FPM's substantially longer effective depth of field (5.5 times longer), our work indicates that, in the near-maximum NA operation regime, the FPM has significant resolution and depth of field advantages over incoherent standard microscopy.

Topics & Concepts

OpticsNumerical aperturePtychographyResolution (logic)Image resolutionFourier transformMicroscopyMicroscopeAperture (computer memory)PhysicsNear-field scanning optical microscopeNear and far fieldDepth of focus (tectonics)Materials scienceOptical microscopeDiffractionComputer scienceWavelengthSubductionTectonicsAcousticsQuantum mechanicsPaleontologyBiologyScanning electron microscopeArtificial intelligenceAdvanced X-ray Imaging TechniquesDigital Holography and MicroscopyAdvanced Electron Microscopy Techniques and Applications
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