Litcius/Paper detail

A high-speed and triple-node-upset recovery latch with heterogeneous interconnection

Zhengfeng Huang, Hao Wang, Yang Ang, Huaguo Liang, Yiming Ouyang, Tianming Ni

2021Microelectronics Journal15 citationsDOI

Topics & Concepts

InterconnectionUpsetNode (physics)Computer scienceParallel computingEngineeringComputer networkStructural engineeringMechanical engineeringRadiation Effects in ElectronicsVLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure Analysis
A high-speed and triple-node-upset recovery latch with heterogeneous interconnection | Litcius