Automated microstructural segmentation and grain size measurement of Al + SiC nanocomposites using advanced image processing techniques on backscattered electron images
Katika Harikrishna, Abeyram M. Nithin, M. J. Davidson
Topics & Concepts
Materials scienceNanocompositeGrain sizeSegmentationImage processingElectronMicrostructureComposite materialArtificial intelligenceImage (mathematics)Computer scienceQuantum mechanicsPhysicsAluminum Alloys Composites PropertiesAdvanced Surface Polishing TechniquesMicrostructure and mechanical properties