The FMR line width and the structure in YIG films deposited by MOD on silicon (1 0 0)
L.K.C.S. Assis, J. E. Abrão, A. S. Carvalho, L.A.P. Gonçalves, A. Galembeck, E. Padrón‐Hernández
Topics & Concepts
Materials scienceLaser linewidthFerromagnetic resonanceYttrium iron garnetScanning electron microscopeSiliconFerromagnetismDiffractionMetalPhase (matter)Condensed matter physicsNuclear magnetic resonanceAnalytical Chemistry (journal)OpticsComposite materialMagnetic fieldMagnetizationMetallurgyChemistryPhysicsOrganic chemistryLaserQuantum mechanicsChromatographyMagneto-Optical Properties and ApplicationsMagnetic properties of thin filmsSurface Roughness and Optical Measurements