Reliability acceptance sampling plan for degraded products subject to Wiener process with unit heterogeneity
Huiling Zheng, Jun Yang, Houbao Xu, Yu Zhao
Topics & Concepts
Test planAcceptance samplingReliability (semiconductor)Sampling (signal processing)Mathematical optimizationConstraint (computer-aided design)Computer scienceProcess (computing)Plan (archaeology)Monotonic functionReliability engineeringWiener processSample size determinationStatisticsMathematicsEngineeringFilter (signal processing)ArchaeologyQuantum mechanicsComputer visionPhysicsGeometryPower (physics)Operating systemMathematical analysisHistoryWeibull distributionReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsSoftware Reliability and Analysis Research