Review of optical measurement techniques for measuring three-dimensional topography of inner-wall-shaped parts
Fanwei Jiao, Lei Liu, Weisheng Cheng, Li Chen, Xiaodong Zhang
Topics & Concepts
Measure (data warehouse)Surface (topology)Key (lock)System of measurementComputer scienceEngineering drawingEngineeringGeometryMathematicsPhysicsData miningAstronomyComputer securityOptical measurement and interference techniquesSurface Roughness and Optical MeasurementsAdvanced Measurement and Metrology Techniques