Reliability improvement on assembly accuracy with maximum out-of-tolerance probability analysis and prior precise repair optimization
Feiyan Guo, Yongfeng Hou, Qingdong Xiao, Xuerui Zhang, Shihong Xiao, Zhongqi Wang
Topics & Concepts
Reliability (semiconductor)Range (aeronautics)Reliability engineeringEvent (particle physics)Computer scienceFunction (biology)AlgorithmEngineeringPower (physics)Aerospace engineeringBiologyPhysicsEvolutionary biologyQuantum mechanicsManufacturing Process and OptimizationTechnology Assessment and ManagementProduct Development and Customization