Investigation of total ionizing dose effects in 4H–SiC power MOSFET under gamma ray radiation
Yabin Sun, Xin Wan, Ziyu Liu, Hu Jin, Junzheng Yan, Xiaojin Li, Yanling Shi
Topics & Concepts
Ionizing radiationAbsorbed doseRadiationThreshold voltageMaterials scienceOptoelectronicsMOSFETCapacitanceIrradiationVoltageGamma rayTransistorRadiation damageRadiation resistanceElectrical engineeringChemistryPhysicsOpticsNuclear physicsElectrodePhysical chemistryEngineeringSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesRadiation Effects in Electronics