Developing a semi-supervised learning and ordinal classification framework for quality level prediction in manufacturing
Gyeongho Kim, Jae Gyeong Choi, Minjoo Ku, Sunghoon Lim
Topics & Concepts
Computer scienceMachine learningArtificial intelligenceArtificial neural networkSupervised learningEntropy (arrow of time)Quality (philosophy)Ordinal optimizationData miningOrdinal dataPhilosophyEpistemologyPhysicsQuantum mechanicsIndustrial Vision Systems and Defect DetectionAdvanced Statistical Process MonitoringFace and Expression Recognition